Abstract: Modeling Coniferous Canopy Structure over Extensive Areas for Ray Tracing Simulations: Scaling from the Leaf to the Stand Level (2015 AGU Fall Meeting)

Modeling Coniferous Canopy Structure over Extensive Areas for Ray Tracing Simulations: Scaling from the Leaf to the Stand Level

Martin van Leeuwen¹, Jan A van Aardt¹, David Kelbe², Thomas Kampe³ and Keith Krause³, (1)Rochester Institute of Technology, Rochester, NY, United States, (2)Oak Ridge National Laboratory, Oak Ridge, TN, United States, (3)NEON, Boulder, CO, United States

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