Abstract: Modeling Coniferous Canopy Structure over Extensive Areas for Ray Tracing Simulations: Scaling from the Leaf to the Stand Level (2015 AGU Fall Meeting)

Modeling Coniferous Canopy Structure over Extensive Areas for Ray Tracing Simulations: Scaling from the Leaf to the Stand Level

Martin van Leeuwen¹, Jan A van Aardt², David Kelbe³, Thomas Kampe⁴ and Keith Krause⁴, (1)Rochester Institute of Technology, Rochester, NY, United States, (2)Rochester Institute of Technology, Imaging Science, Rochester, United States, (3)Oak Ridge National Laboratory, Oak Ridge, TN, United States, (4)NEON, Boulder, CO, United States

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