MR21B-2612
Dielectric Signatures of Annealing in Glacier Ice
Tuesday, 15 December 2015
Poster Hall (Moscone South)
Robert E Grimm1, David E Stillman1 and Joseph A MacGregor2, (1)Southwest Research Institute Boulder, Boulder, CO, United States, (2)University of Texas, Institute for Geophysics, Austin, TX, United States
Abstract:
We analyzed the dielectric spectra of 49 firn and ice samples from ice sheets and glaciers to better understand how differing ice formation and evolution affect electrical properties. The dielectric relaxation of ice is well known and its characteristic frequency increases with the concentration of soluble impurities in the ice lattice. We found that meteoric ice and firn generally possess two such relaxations, indicating distinct crystal populations or zonation. Typically, one population is consistent with that of relatively pure ice, and the other is significantly more impure. However, high temperatures (e.g., temperate ice), long residence times (e.g., ancient ice from Mullins Glacier, Antarctica), or anomalously high impurity concentrations favor the development of a single relaxation. These relationships suggest that annealing causes two dielectrically distinct populations to merge into one population. The dielectric response of temperate ice samples indicates increasing purity with increasing depth, suggesting final rejection of impurities from the lattice. Separately, subglacially frozen samples from the Vostok 5G ice core possess a single relaxation whose variable characteristic frequency likely reflects the composition of the source water. Multi-frequency electrical measurements on cores and in the field can track annealing of glacier ice.