EP54B-08
Multi-scale Analysis of High Resolution Topography: Feature Extraction and Identification of Landscape Characteristic Scales

Friday, 18 December 2015: 17:45
2003 (Moscone West)
Paola Passalacqua, University of Texas at Austin, Dept. of Civil, Architectural and Environmental Engineering, Austin, TX, United States, Harish Sangireddy, University of Texas at Austin, Austin, TX, United States and Colin Peter Stark, Columbia University of New York, Palisades, NY, United States
Abstract:
With the advent of digital terrain data, detailed information on terrain characteristics and on scale and location of geomorphic features is available over extended areas. Our ability to observe landscapes and quantify topographic patterns has greatly improved, including the estimation of fluxes of mass and energy across landscapes. Challenges still remain in the analysis of high resolution topography data; the presence of features such as roads, for example, challenges classic methods for feature extraction and large data volumes require computationally efficient extraction and analysis methods. Moreover, opportunities exist to define new robust metrics of landscape characterization for landscape comparison and model validation.

In this presentation we cover recent research in multi-scale and objective analysis of high resolution topography data. We show how the analysis of the probability density function of topographic attributes such as slope, curvature, and topographic index contains useful information for feature localization and extraction. The analysis of how the distributions change across scales, quantified by the behavior of modal values and interquartile range, allows the identification of landscape characteristic scales, such as terrain roughness. The methods are introduced on synthetic signals in one and two dimensions and then applied to a variety of landscapes of different characteristics. Validation of the methods includes the analysis of modeled landscapes where the noise distribution is known and features of interest easily measured.