Off-fault tip splay networks: a genetic and generic property of faults indicative of their long-term propagation, and a major component of off-fault damage

Abstract:

Faults grow over the long-term by accumulating displacement and lengthening, i.e., propagating laterally. We use fault maps and fault propagation evidences available in literature to examine geometrical relations between parent faults and off-fault splays. The population includes 47 worldwide crustal faults with lengths from millimeters to thousands of kilometers and of different slip modes. We show that fault splays form adjacent to any propagating fault tip, whereas they are absent at non-propagating fault ends. Independent of parent fault length, slip mode, context, etc, tip splay networks have a similar fan shape widening in direction of long-term propagation, a similar relative length and width (~30 and ~10 % of parent fault length, respectively), and a similar range of mean angles to parent fault (10-20°). Tip splays more commonly develop on one side only of the parent fault. We infer that tip splay networks are a genetic and a generic property of faults indicative of their long-term propagation. We suggest that they represent the most recent damage off-the parent fault, formed during the most recent phase of fault lengthening. The scaling relation between parent fault length and width of tip splay network implies that damage zones enlarge as parent fault length increases. Elastic properties of host rocks might thus be modified at large distances away from a fault, up to 10% of its length. During an earthquake, a significant fraction of coseismic slip and stress is dissipated into the permanent damage zone that surrounds the causative fault. We infer that coseismic dissipation might occur away from a rupture zone as far as a distance of 10% of the length of its causative fault. Coseismic deformations and stress transfers might thus be significant in broad regions about principal rupture traces. This work has been published in Comptes Rendus Geoscience under doi:10.1016/j.crte.2015.05.002 (http://www.sciencedirect.com/science/article/pii/S1631071315000528).