Improved Modeling of Surface Layer Parameters in a AGCM Using Refined Vertical Resolution in the Surface Layer

Hyeyum Hailey Shin1,2, Ming Zhao3, Yi Ming4, Prof. Xi Chen3,5 and Shian-Jiann Lin3, (1)UCAR CPAESS, Boulder, CO, United States, (2)NOAA, GFDL, Princeton, NJ, United States, (3)Geophysical Fluid Dynamics Laboratory, Princeton, NJ, United States, (4)Boston College, Chestnut Hill, MA, United States, (5)Institute of Atmospheric Physics, Chinese Academy of Sciences, Beijing, China