EP22C:
Satellite Land Surface Reflectance at Medium-/High-Resolution: Algorithms, Validation, and Applications I
Submit an Abstract to this Session
EP22C:
Satellite Land Surface Reflectance at Medium-/High-Resolution: Algorithms, Validation, and Applications I
Satellite Land Surface Reflectance at Medium-/High-Resolution: Algorithms, Validation, and Applications I
Session ID#: 35457
Session Description:
We solicit papers on the inversion and use of reflectance products from Landsat(s) and Sentinel 2 sensors with other sensors. For the last years, medium and high resolutions became a useful and a powerful toll for Earth studies. Topics of interest mainly include (not limited to):
- Algorithm description and validation (including Cloud screening, Aerosol inversion, Radiative transfer);
- Use of products in agricultural monitoring applications (such as crop area, crop type, crop growing, yield estimation and prediction, damage assessment);
- Data integration / Harmonized products from both sensors with others;
- Theoretical studies for sensors capabilities enhancements (e.g. addition of spectral bands) to future sensors for agriculture application;
- Development and use of new vegetation indices (i.e. red edge) and other products for agriculture applications.
Depending on outcome, we think about a special issue.
Primary Convener: Jean-Claude Roger, University of Maryland College Park, Department of Geographical Sciences, College Park, MD, United States
Conveners: Shinichi Sobue, Japan Aerospace Exploration Agency, Kanagawa, Japan and Ferran Gascon, European Space Research Institute, Frascati, Italy
Chairs: Jean-Claude Roger, University of Maryland College Park, Department of Geographical Sciences, College Park, MD, United States and Shinichi Sobue, Japan Aerospace Exploration Agency, Kanagawa, Japan
OSPA Liaison: Jean-Claude Roger, University of Maryland College Park, Department of Geographical Sciences, College Park, MD, United States
Index Terms:
Abstracts Submitted to this Session:
See more of: Earth and Planetary Surface Processes
