Abstract: Properties of magmas at depth from SiO<sub>2</sub> density and local structure measured using X-ray absorption and X-ray Raman spectroscopy (AGU Fall Meeting 2018)

Properties of magmas at depth from SiO₂ density and local structure measured using X-ray absorption and X-ray Raman spectroscopy

Sylvain Petitgirard¹, Wim Malfait², Christoph Sahle³, Christopher Weis⁴, Baptiste Journaux⁵, Ines Collings², Keith Gilmore⁶, Georg Spiekermann⁷, John S Tse⁸, Valerio Cerantola⁶, David C Rubie⁹, Max Wilke¹⁰ and Christian Sternemann⁴, (1)Bayerisches Geoinstitut, Universitaet Bayreuth, Bayreuth, Germany, (2)Empa, Duebendorf, Switzerland, (3)ESRF Grenoble, Grenoble, France, (4)TU Dortmund, Dortmund, Germany, (5)University of Washington Seattle Campus, Department of Earth and Space Sciences, Seattle, United States, (6)ESRF European Synchrotron Radiation Facility, Grenoble, France, (7)University of Potsdam, Potsdam, Germany, (8)University of Saskatchewan, Saskatoon, SK, Canada, (9)University of Bayreuth, Bayreuth, Germany, (10)Deutsches GeoForschungsZentrum, Potsdam, Germany

Back to: Advanced Experimental and Analytical Approaches in Minerals Studies I

Properties of magmas at depth from SiO2 density and local structure measured using X-ray absorption and X-ray Raman spectroscopy

Properties of magmas at depth from SiO₂ density and local structure measured using X-ray absorption and X-ray Raman spectroscopy