Understanding AMSR-2 Brightness Temperatures Characterizations over U.S.A in the Presence/Absence of Radio Frequency Interference Contaminations


Dingkun Phillip Yan, Organization Not Listed, Washington, DC, United States, Wei Li, Stevens Institute of Technology, Hoboken, NJ, United States, Nan Chen, Stevens Institute of Technology, Union City, NJ, United States and Yongzhen Fan, Stevens Institute of Technology, Hoboken, United States
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