Shionohira Fault Characterization Using SIMFIP Protocol


Kazuhiro Aoki1, Yves Guglielmi2, Paul J Cook3, Takahiro Watanabe4, Yukumo Tanaka1 and Kazuyoshi Seshimo1, (1)Japan Atomic Energy Agency, Department of Construction, Tokai, Japan, (2)University of California Berkeley, Berkeley, United States, (3)Lawrence Berkeley National Laboratory (LBNL), Berkeley, United States, (4)Japan Atomic Energy Agency, Department of construction, Tokai, Japan