Monitoring Induced Fractures with Electrical Measurements using Depth to Surface Resistivity: A Field Case Study

Michael Wilt1, Gregory Nieuwenhuis2, Shengjie Sun2,3 and Kristopher MacLennan4, (1)Lawrence Berkeley National Laboratory, Berkeley, CA, United States, (2)GroundMetrics Inc., San Diego, CA, United States, (3)GroundMetrics, Inc, San Diego, CA, United States, (4)GroundMetrics Inc., San Diego, United States