Deformation of Zircon Under High Pressure
Abstract ID#: 34206
Angle-dispersive X-ray diffraction in a radial geometry using a diamond anvil cell was performed at beamline X17C, National Synchrotron Light Source, Brookhaven National Laboratory. Our results showed that zircon is sensitive to stress and weak deformation was observed even at 1 GPa. Ratios of differential stress to shear modulus (t/G) are in the range of 0.002- 0.008 at pressure to 30 GPa. Differential stress supported by zircon showed that (200) is the weakest plane and could be responsible for the onset of deformation. Zircon to reidite transformation was found at above 18 GPa, which is slightly lower than previous studies. Our results suggested shear strength may play a key role for the transition. Our volume data fitted to Birch-Murnaghan equation of state yielded a bulk modulus of 270.03±4.6 GPa (K0=4), in broad agreement with previous reports. Weak texture in (100) was observed at low pressure and became more profound with pressure. At pressure above 11-13 GPa, (100) texture rotated towards to (111) due to the applied stress.
